USA -CHINA Happy New Year Joint First Day Cover Issued in San Francisco on 01/06/2000, Stamps and Cover Designed by Stamp Designers: Clarence Lee of USA, and Guo Chenghui of China, Autographed by Clarence Lee of Honolulu, Limtied Edition

Name: USA -CHINA Happy New Year Joint First Day Cover Issued in San Francisco on 01/06/2000, Stamps and Cover Designed by Stamp Designers: Clarence Lee
Price: 17.58 OMR
Availability: InStock

Product ID: 484954775

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The product exactly matches the description. Very satisfied with my purchase.

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The MOLLE sheath is of exceptional quality. Very happy with my purchase.

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Anita G.

Good experience, but the tracking updates could be better.

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Smooth transaction and product arrived in perfect condition.

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